L. Werner et J. Fischer, Fast calibration of photodiodes in the near-infrared, visible and ultraviolet using a Fourier-transform spectrometer, METROLOGIA, 35(4), 1998, pp. 403-406
A new, fast method for broadband secondary calibrations of photodiodes agai
nst a calibrated reference diode has been developed. It is based on a Fouri
er-transform spectrometer (PTS) and does not require any exchange of the li
ght source, grating or higher-order filter. With the present set-up, it tak
es only 10 minutes to measure the spectral responsivity ratios of three unk
nown photodiodes compared with a reference photodiode from 200 nm to 1000 n
m. The estimated uncertainty of 0.05% of the responsivity ratios was confir
med by independent measurements using intensity-stabilized laser radiation
at twelve wavelengths between 238 nm and 1000 nm. The combination of the un
certainties of the new secondary FTS calibration method and those of the re
ference diode's primary calibration at the cryogenic radiometer shows that
an efficient, practicable way has been found to provide customers with phot
odiodes as working standards of spectral responsivity for wavelengths from
1000 nm to 200 nm with uncertainties of 0.05% to 0.2% (near-infrared and vi
sible to ultraviolet).