Ion-induced erosion of organic self-assembled monolayers

Citation
P. Cyganik et al., Ion-induced erosion of organic self-assembled monolayers, NUCL INST B, 148(1-4), 1999, pp. 137-142
Citations number
15
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences","Instrumentation & Measurement
Journal title
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
ISSN journal
0168583X → ACNP
Volume
148
Issue
1-4
Year of publication
1999
Pages
137 - 142
Database
ISI
SICI code
0168-583X(199901)148:1-4<137:IEOOSM>2.0.ZU;2-E
Abstract
Laser post-ionization mass spectrometry combined with Scanning Tunneling Mi croscopy (STM) has been used to investigate processes of ion-stimulated ero sion of self-assembled monolayers (SAM) of phenethyl mercaptan C6H5CH2CH2S (PEM) deposited on gold. Results indicate that only PEM fragments are emitt ed from the surface. Most of the PEM fragments (predominantly C6H5CH2CH3 wi th m/z = 106) are emitted with thermal kinetic energies. STM images collect ed on 8 keV H-2(-)-irradiated surfaces with a system tuned to probe electro nic states of sulfur atoms show no additional damage induced by irradiation . This indicates that sulfur atoms are not removed from the surface during hydrogen bombardment. It is proposed that the emission of SAM molecules is initiated by chemical reactions which gently break C-S bonds. (C) 1999 Else vier Science B.V. All rights reserved.