Ion beam modification of PES, PS and PVC polymers

MeV ions passing through polymer films modify their electrical and optical properties and these changes are related to changes in the chemical structu res of the polymers. The effects of certain cross linking enhancers, such a s sulfur and other pendant molecules, on the ion beam modification process were investigated. Stacked, thin films of polyethersulfone, polyvinyl chlor ide and polystyrene were bombarded with MeV helium ions and the induced cha nges in the chemical structure of the polymers were studied with Raman micr oprobe analysis and RES combined with in situ residual gas analysis. FTIR s pectroscopy was used to categorize the changes in the optical properties. T he results were then compared with those from previously studied polyethyle ne and polyvinylidene chloride polymers. (C) 1999 Elsevier Science B.V. All rights reserved.