Polarization effects in apertureless scanning near-field optical microscopy: an experimental study

Citation
L. Aigouy et al., Polarization effects in apertureless scanning near-field optical microscopy: an experimental study, OPTICS LETT, 24(4), 1999, pp. 187-189
Citations number
14
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Optics & Acoustics
Journal title
OPTICS LETTERS
ISSN journal
01469592 → ACNP
Volume
24
Issue
4
Year of publication
1999
Pages
187 - 189
Database
ISI
SICI code
0146-9592(19990215)24:4<187:PEIASN>2.0.ZU;2-5
Abstract
Strong electric-field enhancements at the apex of a tungsten tip illuminate d by an external light source were recently predicted theoretically. We pre sent an experimental study of the dependence of this effect on the polariza tion angle of the incident light. It is shown that the intensity of the lig ht scattered by the tungsten tip of an apertureless scanning near-field opt ical microscope is 2 orders of magnitude higher when the incident light is p polarized than when it is s polarized. This experimental result is in goo d agreement with theoretical predictions and provides an easy way to test t he quality of the tips. (C) 1999 Optical Society of America OCIS codes: 120 .5820, 170.5810, 260.2110, 260.5430.