V. Nehasil et al., MINIATURE ELECTRON-BOMBARDMENT EVAPORATION SOURCE - EVAPORATION RATE MEASUREMENT, Czechoslovak journal of Physics, 47(3), 1997, pp. 261-268
Miniature electron beam evaporation sources which operate on the princ
iple of vaporization of source material, in the form of a tip, by elec
tron bombardment are produced by several companies specialised in UHV
equipment. These sources are used primarily for materials that are nor
mally difficult to deposit due to their high evaporation temperature.
They are appropriate for special applications, like heteroepitaxial th
in films growth that require very low and well controlled deposition r
ate. We propose a simple and easily applicable method of evaporation r
ate control. The method is based on the measurement of ion current pro
duced by electron bombardment of evaporated atoms. In order to be able
to determine the ion current - evaporation flux calibration curves we
measured the absolute values of evaporation flux by means of Bayard-A
lpert ion gauge.