A new low energy electron microscope

Authors
Tromp, RM Mankos, M Reuter, MC Ellis, AW Copel, M
Citation
Rm. Tromp et al., A new low energy electron microscope, SURF REV L, 5(6), 1998, pp. 1189-1197
Citations number
12
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
SURFACE REVIEW AND LETTERS
ISSN journal
0218625X → ACNP
Volume
5
Issue
6
Year of publication
1998
Pages
1189 - 1197
Database
ISI
SICI code
0218-625X(199812)5:6<1189:ANLEEM>2.0.ZU;2-9
Abstract
Low energy electron microscopy (LEEM) has developed into one of the premier techniques for in situ studies of surface dynamical processes, such as epi taxial growth, phase transitions, chemisorption and strain relaxation pheno mena. Over the last three years we have designed and constructed a new LEEM instrument, aimed at improved resolution, improved diffraction capabilitie s and greater ease of operation compared to present instruments.