BENDING ENERGY OF AMPHIPHILIC FILMS AT THE NANOMETER-SCALE

Citation
C. Gourier et al., BENDING ENERGY OF AMPHIPHILIC FILMS AT THE NANOMETER-SCALE, Physical review letters, 78(16), 1997, pp. 3157-3160
Citations number
24
Categorie Soggetti
Physics
Journal title
ISSN journal
00319007
Volume
78
Issue
16
Year of publication
1997
Pages
3157 - 3160
Database
ISI
SICI code
0031-9007(1997)78:16<3157:BEOAFA>2.0.ZU;2-T
Abstract
The diffuse scattering of x rays by the thermally excited out-of-plane fluctuations of different amphiphilic films was measured for in-plane wavelengths down to the nanometer range, giving access to nontrivial bending effects. The Helfrich Hamiltonian applies on pure water and in the solid phase of an arachidic acid monolayer a large bending rigidi ty constant was measured. When formed on a subphase containing divalen t cadmium ions, the height-height fluctuation spectrum (z(q)z(-q)) is greatly modified: no longer consistent with a q(-1) law at large wavel engths but rather with a q(-3.3+/-0.2) law, revealing a very different physical mechanism whose origin is discussed.