Application of atomic force microscopy in fundamental adhesion studies

Authors
Hayes, RA Ralston, J
Citation
Ra. Hayes et J. Ralston, Application of atomic force microscopy in fundamental adhesion studies, MATER ENGN, 14, 1999, pp. 121-138
Categorie Soggetti
Current Book Contents
Journal title
ADHESION PROMOTION TECHNIQUES: TECHNOLOGICAL APPLICATIONS → ACNP
Volume
14
Year of publication
1999
Pages
121 - 138
Database
ISI
SICI code