Ap. Jephcoat et al., High-resolution synchrotron X-ray powder diffraction and Rietveld structure refinement of two (Mg0.95Fe0.05)SiO3 perovskite samples synthesized underdifferent oxygen fugacity conditions, AM MINERAL, 84(3), 1999, pp. 214-220
This paper presents high-resolution synchrotron X-ray powder diffraction da
ta at 290 K on two Fe-bearing, polycrystalline silicate perovskite samples
with approximate compositions (Mg0.95Fe0.05)SiO3 synthesized at 25 GPa and
1920 K in a multi-anvil press at different oxygen fugacity conditions. Moss
bauer studies have indicated that Fe3+/Sigma Fe for the samples are 0.09 +/
- 0.01 and near 0.16 +/- 0.03. Rietveld structural refinements confirm that
Fe2+ and Fe3+ dominantly substitute for Mg2+ in the 8-fold to 12-fold coor
dinated A site for both compositions. There appears to be no significant di
fferences in the bond distances for these amounts of Fe3+ and no conclusive
structural evidence to support indications from Mossbauer experiments that
Fe3+ may occupy both A and B sites. To explore the effect of valence state
further, this study also reports the first diffraction patterns of (Mg,Fe)
SiO3 perovskite collected at a wavelength near the Fe absorption edge.