V. Karanassios et Tj. Wood, Development and characterization of an automated direct sample insertion inductively coupled plasma atomic emission spectrometry system, APPL SPECTR, 53(2), 1999, pp. 197-204
A new direct sample insertion (DSI) device that can be used vertically with
inductively coupled plasma atomic emission spectrometry (ICP-AES) or horiz
ontally with ICP mass spectrometry (ICP-MS) has been designed, and an autom
ated ICP-AES system has been developed around this DSI device. The automate
d DSI-ICP-AES system was characterized by using microliter volumes of liqui
ds and milligram amounts of powders. Analysis of solids with minimum pretre
atment was a key goal in developing this system, and several calibration me
thods for powders were investigated. Examples of these are liquid standards
, a few milligrams of different reference material or a different weight of
the same material and standard additions of liquids onto a powder in the c
up. Sample handling, weighing, sampling, and homogeneity concerns were part
ially addressed by using slurries. In addition, slurry DSI-ICP-AES for bota
nical, geological, and biological powdered reference materials is briefly d
escribed. Carbide formation is a key chemical limitation of graphite-cup DS
Is, and it was addressed by using in situ chemical modification by mixing S
F6 with the plasma gases.