Development and characterization of an automated direct sample insertion inductively coupled plasma atomic emission spectrometry system

Citation
V. Karanassios et Tj. Wood, Development and characterization of an automated direct sample insertion inductively coupled plasma atomic emission spectrometry system, APPL SPECTR, 53(2), 1999, pp. 197-204
Citations number
34
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences
Journal title
APPLIED SPECTROSCOPY
ISSN journal
00037028 → ACNP
Volume
53
Issue
2
Year of publication
1999
Pages
197 - 204
Database
ISI
SICI code
0003-7028(199902)53:2<197:DACOAA>2.0.ZU;2-P
Abstract
A new direct sample insertion (DSI) device that can be used vertically with inductively coupled plasma atomic emission spectrometry (ICP-AES) or horiz ontally with ICP mass spectrometry (ICP-MS) has been designed, and an autom ated ICP-AES system has been developed around this DSI device. The automate d DSI-ICP-AES system was characterized by using microliter volumes of liqui ds and milligram amounts of powders. Analysis of solids with minimum pretre atment was a key goal in developing this system, and several calibration me thods for powders were investigated. Examples of these are liquid standards , a few milligrams of different reference material or a different weight of the same material and standard additions of liquids onto a powder in the c up. Sample handling, weighing, sampling, and homogeneity concerns were part ially addressed by using slurries. In addition, slurry DSI-ICP-AES for bota nical, geological, and biological powdered reference materials is briefly d escribed. Carbide formation is a key chemical limitation of graphite-cup DS Is, and it was addressed by using in situ chemical modification by mixing S F6 with the plasma gases.