Heavy ion linear energy transfer measurements during single event upset testing of electronic devices

A heavy ion beam diagnostic system installed at the Brookhaven Single Event Upset Test Facility is described. Calibration of the system with the help of a-particles, essential for linear energy transfer (LET) measurements, is discussed, Measured LET values for 20 different ions, including Li-7, B-9, C-12, O-16, F-19, Si-28, S-32, Cl-35, Ca-40, Sc-45, Ti-48, Fe-56, Ni-58, C u-63, Ge-74, Br-79, Ag-107, I-127, Au-197, and U-235, with energies between 0.5 and 8.5 MeV/AMU but not exceeding 400 MeV for the heaviest ions, are p resented in both graphical and numerical forms. Results are compared to pre dictions of the TRIM-90 simulation program, with an average difference betw een the measured and calculated values of 2 +/- 6%.