A setup for monitoring spectral characteristics of photocathodes during the
ir production and For measuring spectral characteristics of produced device
s and light filters in a wavelength range of 220-1100 nm is described. The
setup is designed for the fact that the process occurs at temperatures of u
p to 250 degrees C with the presence of spurious illumination and supply-li
ne-induced electric noises. A light guide brings light signals to the techn
ological chamber and the measuring detector.