A setup for measuring spectral characteristics

Citation
G. Vilkaitis et al., A setup for measuring spectral characteristics, INSTR EXP R, 41(6), 1998, pp. 840-843
Citations number
3
Categorie Soggetti
Instrumentation & Measurement
Journal title
INSTRUMENTS AND EXPERIMENTAL TECHNIQUES
ISSN journal
00204412 → ACNP
Volume
41
Issue
6
Year of publication
1998
Pages
840 - 843
Database
ISI
SICI code
0020-4412(199811/12)41:6<840:ASFMSC>2.0.ZU;2-#
Abstract
A setup for monitoring spectral characteristics of photocathodes during the ir production and For measuring spectral characteristics of produced device s and light filters in a wavelength range of 220-1100 nm is described. The setup is designed for the fact that the process occurs at temperatures of u p to 250 degrees C with the presence of spurious illumination and supply-li ne-induced electric noises. A light guide brings light signals to the techn ological chamber and the measuring detector.