Oscillator strength of excitons in (In,Ga)As/GaAs quantum wells in the presence of a large electric field

Citation
C. Monier et al., Oscillator strength of excitons in (In,Ga)As/GaAs quantum wells in the presence of a large electric field, J APPL PHYS, 85(5), 1999, pp. 2713-2718
Citations number
31
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF APPLIED PHYSICS
ISSN journal
00218979 → ACNP
Volume
85
Issue
5
Year of publication
1999
Pages
2713 - 2718
Database
ISI
SICI code
0021-8979(19990301)85:5<2713:OSOEI(>2.0.ZU;2-M
Abstract
The oscillator strength of the fundamental heavy-hole exciton in strained q uantum well (QW) InxGa1-xAs/GaAs p-i-n diode heterostructures is calculated by using a variational approach combined with the transfer matrix formalis m. Unlike the weak well thickness dependence of the excitonic properties in the absence of electric field, a completely different picture is observed as the strength of the built-in electric field increases. A dramatic reduct ion of the QW oscillator strength is noticed for thick wells over the entir e indium composition range. This is thought to be induced by a very effecti ve quantum confined Stark effect that becomes a limiting factor for maximiz ed absorption properties. In contrast, calculations for highly strained (x > 0.20) thin (less than 50 Angstrom) structures evidence oscillator strengt h values as large as those found with zero electric field. Finally, the res ults of this study stress adequate well thickness/composition selection for improved performance of optoelectronic multiple QW-based devices such as m odulators and photoconverters. (C) 1999 American Institute of Physics. [S00 21-8979(99)06604-9].