Citation
D. Ochoa et al., Device simultaneous determination of the source and cavity parameters of amicrocavity light-emitting diode, J APPL PHYS, 85(5), 1999, pp. 2994-2996
Citations number
9
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF APPLIED PHYSICS
ISSN journal
00218979
→ ACNP
Volume
85
Issue
5
Year of publication
1999
Pages
2994 - 2996
Database
ISI
SICI code
0021-8979(19990301)85:5<2994:DSDOTS>2.0.ZU;2-0
Abstract
Detuning between the emission line and the Fabry-Perot wavelength is a crit
ical parameter for microcavity light-emitting diode (MCLED) design with reg
ard to the efficiency and emission directionality. We present here a method
to measure simultaneously the detuning and the linewidth of the source emi
tter on the device itself. This method uses numerical simulations and a fit
ting procedure with the angular emission pattern measured on the MCLED. It
is accurate, nondestructive and easy to implement. (C) 1999 American Instit
ute of Physics. [S0021-8979(99)06504-4].