We report on a double-channel AlGaN/GaN heterostructure field-effect transi
stor (HFET) for high power applications, where the bottom channel is formed
by a GaN/AlGaN/GaN semiconductor-insulator-semiconductor structure. The ba
nd structure and the charge distribution are strongly influenced by the pie
zoelectric effect caused by the mismatch between AlGaN and GaN. This new de
sign demonstrates that the current carrying capability of AlGaN/GaN HFETs c
an be enhanced using multichannel structures. (C) 1999 American Institute o
f Physics. [S0021-8979(99)03305-8].