REAL-TIME IN-SITU OBSERVATION OF PVD OF N-VINYLCARBAZOLE WITH FTIR-RAS

N-vinylcarbazole (NVCz) was deposited on the glass substrate, coated w ith Ag 100 nm thick, at temperatures of 260 K and lower. Realtime in-s itu observation of the deposition and the re-evaporation were carried out with Fourier transform infrared reflection absorption spectroscopy . NVCz deposited first as type I in which the angle between the carbaz ole-ring plane and the substrate surface was 60 degrees. When the thic kness reached around 200 nm, the rearrangement from type I to type II having the angle of 69 degrees was induced. After re-evaporation of ty pe I, a type II layer 90 nm thick remained. The heat flow correspondin g to the rearrangement which was observed in the deposited film was no t observed in a deferential thermal analysis of intrinsic NVCz. (C) 19 97 Elsevier Science S.A.