Cross-section TEM and optical characterization of porous silicon multilayer stacks

Authors
Martin-Palma, RJ Herrero, P Guerrero-Lemus, R Moreno, JD Martinez-Duart, JM
Citation
Rj. Martin-palma et al., Cross-section TEM and optical characterization of porous silicon multilayer stacks, J MAT SCI L, 17(10), 1998, pp. 845-847
Citations number
8
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
JOURNAL OF MATERIALS SCIENCE LETTERS
ISSN journal
02618028 → ACNP
Volume
17
Issue
10
Year of publication
1998
Pages
845 - 847
Database
ISI
SICI code
0261-8028(19980515)17:10<845:CTAOCO>2.0.ZU;2-5