Dielectric breakdown patterns and active walker model

Authors
Sheu, CR Cheng, CY Pan, RP
Citation
Cr. Sheu et al., Dielectric breakdown patterns and active walker model, PHYS REV E, 59(2), 1999, pp. 1540-1544
Citations number
16
Categorie Soggetti
Physics
Journal title
PHYSICAL REVIEW E
ISSN journal
1063651X → ACNP
Volume
59
Issue
2
Year of publication
1999
Part
A
Pages
1540 - 1544
Database
ISI
SICI code
1063-651X(199902)59:2<1540:DBPAAW>2.0.ZU;2-A
Abstract
Simulations based on the active walker model an used successfully to recons truct the dielectric breakdown patterns observed in a cell with parallel-pl ate electrodes. Different types of patterns can be obtained with suitable p arameters. These parameters correspond to the electrical and environmental conditions during the breakdown.