Wet-chemical nanoscale patterning of GaAs surfaces using atomic force microscope lithography

Citation
B. Klehn et al., Wet-chemical nanoscale patterning of GaAs surfaces using atomic force microscope lithography, SUPERLATT M, 25(1-2), 1999, pp. 473-476
Citations number
23
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
SUPERLATTICES AND MICROSTRUCTURES
ISSN journal
07496036 → ACNP
Volume
25
Issue
1-2
Year of publication
1999
Pages
473 - 476
Database
ISI
SICI code
0749-6036(199901/02)25:1-2<473:WNPOGS>2.0.ZU;2-S
Abstract
Sub-100 nm V-grooves in GaAs(001) surfaces have been fabricated by patterni ng a thin photoresist layer with an atomic force microscope (AFM) and subse quent wet-chemical etching. The nanolithography is based on the dynamic plo ughing technique. Anisotropic etchants under investigation are bromine-meth anol-isopropanol, sulfuric acid-hydrogen peroxide-water, citric acid-hydrog en peroxide-water, and ammonium hydroxide-hydrogen peroxide-water. Along th e [110] direction the etched grooves are V-shaped, along [110] the profile is U-shaped. Best results of 50-60-nm wide V-grooves with straight edges an d smooth sidewalls are obtained from bromine-methanol-isopropanol, the othe r etchants form rough grooves. Concerning the reproducibility of the patter ning process, the aqueous etch solutions exceed the bromine etchant. (C) 19 99 Academic Press.