Improved angle interferometer based on total internal reflection

Authors
Citation
Wd. Zhou et Ll. Cai, Improved angle interferometer based on total internal reflection, APPL OPTICS, 38(7), 1999, pp. 1179-1185
Citations number
9
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Optics & Acoustics
Journal title
APPLIED OPTICS
ISSN journal
00036935 → ACNP
Volume
38
Issue
7
Year of publication
1999
Pages
1179 - 1185
Database
ISI
SICI code
0003-6935(19990301)38:7<1179:IAIBOT>2.0.ZU;2-Z
Abstract
We describe an improved interferometer for angle measurement based on the i nternal re flection effect. The improvement is achieved by eliminating the influence of wave-plate rotation on the measurement. In the proposed angle interferometer the wave plate is fixed and placed between a rhomb assembly and a retroreflector. This scheme not only allows the angle interferometer to keep the optical configuration compact but also doubles the resolution a nd can measure the pitch and yaw of moving objects. Both a theoretical anal ysis and an experimental verification have been conducted on the interferom eter. The results indicate that the performance of the modified angle inter ferometer is greatly improved, especially when the rotation angle is large. The nonlinearity error of the measurement equation is also addressed. (C) 1999 Optical Society of America. OCIS codes: 120.3180, 120.3930, 120.3940, 120.4640, 120.5050, 260.5430.