Ballistic electron focusing by elliptic reflecting barriers

Citation
Jj. Heremans et al., Ballistic electron focusing by elliptic reflecting barriers, APPL PHYS L, 74(9), 1999, pp. 1281-1283
Citations number
13
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
74
Issue
9
Year of publication
1999
Pages
1281 - 1283
Database
ISI
SICI code
0003-6951(19990301)74:9<1281:BEFBER>2.0.ZU;2-S
Abstract
We investigate reflection of ballistic electrons off an elliptic barrier in a high quality AlGaAs/GaAs heterostructure. Electrons injected at one foca l point of an ellipse are collected at the second focal point, or at the mi dpoint. Application of a magnetic field perpendicular to the plane of the e llipse modifies the focusing effects by distorting the electrons' paths, re sulting in a novel four-terminal negative magnetoresistance phenomenon. Sev eral secondary features in the magnetoresistance are observed and are inter preted in the light of numerical path simulations. (C) 1999 American Instit ute of Physics. [S0003-6951(99)03809-7].