We report growth of self-organized In0.4Ga0.6 As quantum dots on Si substra
tes by molecular- beam epitaxy. Low-temperature (17 K) photoluminescence sp
ectra show that the optical properties of In0.4Ga0.6 As quantum dots grown
on Si are comparable to quantum dots grown on GaAs substrates. We also pres
ent preliminary characteristics of In0.4Ga0.6 As quantum-dot lasers grown o
n Si substrates. Light versus current measurements at 80 K under pulsed bia
s conditions show that I-th = 3.85 kA/cm(2). The lasing spectral output has
a peak emission wavelength of 1.013 mm and a linewidth (full width at half
maximum) of similar to 4 Angstrom at the threshold. (C) 1999 American Inst
itute of Physics. [S0003-6951(99)02010-0].