We have performed detailed optical measurements of ultrathin InAs/InP quant
um wells grown by metal organic vapor phase epitaxy. Photoluminescence exci
tation spectra reveal the excitonic resonances associated with two- and thr
ee-monolayer thick InAs layers while polarization-dependent measurements cl
early show the heavy- or light-hole nature of the resonances. These resonan
ces, together with their emission bands, can be detected on the same sample
, indicating the presence of well defined regions of different InAs layer t
hickness. We find that the energy position of the excitonic resonances cann
ot be reproduced by effective mass calculations based on the envelope funct
ion approximation. (C) 1999 American Institute of Physics. [S0003-6951(99)0
0510-0].