Non-contact atomic force microscopy imaging of TiO2(100) surfaces

Authors
Raza, H Pang, CL Haycock, SA Thornton, G
Citation
H. Raza et al., Non-contact atomic force microscopy imaging of TiO2(100) surfaces, APPL SURF S, 140(3-4), 1999, pp. 271-275
Citations number
13
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
APPLIED SURFACE SCIENCE
ISSN journal
01694332 → ACNP
Volume
140
Issue
3-4
Year of publication
1999
Pages
271 - 275
Database
ISI
SICI code
0169-4332(199902)140:3-4<271:NAFMIO>2.0.ZU;2-Z
Abstract
Atomically resolved non-contact fm mode atomic force microscopy images have been obtained from TiO2(100) surfaces. The 1 x 1 surface is observed, as w ell as the 1 x 3 phase previously imaged with STM. The morphology of the la tter reconstruction consists of (110) microfacets. An additional reconstruc tion with 1 x 3 symmetry is observed, which is assigned to a phase intermed iate between the 1 x 1 and 1 x 3-microfacet terminations. (C) 1999 Elsevier Science B.V. All rights reserved.