We study a nanometer-sized optical probe and image in a scanning near-field
optical microscope (SNOM). We demonstrated the potential to observe 5-nn w
ide optical patterns using the SNOM. The probe profile was measured by usin
g a knife-edge method and a modulated transfer function evaluation method.
An aluminum covered and pipet-pulled fiber probe used hen has two optical p
robes, one which has a large diameter of 350 nm and one which has a small d
iameter of around 10 nm. (C) 1999 Elsevier Science B.V. All rights reserved
.