Nano-optical image and probe in a scanning near-field optical microscope

Citation
S. Hosaka et al., Nano-optical image and probe in a scanning near-field optical microscope, APPL SURF S, 140(3-4), 1999, pp. 388-393
Citations number
11
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
APPLIED SURFACE SCIENCE
ISSN journal
01694332 → ACNP
Volume
140
Issue
3-4
Year of publication
1999
Pages
388 - 393
Database
ISI
SICI code
0169-4332(199902)140:3-4<388:NIAPIA>2.0.ZU;2-1
Abstract
We study a nanometer-sized optical probe and image in a scanning near-field optical microscope (SNOM). We demonstrated the potential to observe 5-nn w ide optical patterns using the SNOM. The probe profile was measured by usin g a knife-edge method and a modulated transfer function evaluation method. An aluminum covered and pipet-pulled fiber probe used hen has two optical p robes, one which has a large diameter of 350 nm and one which has a small d iameter of around 10 nm. (C) 1999 Elsevier Science B.V. All rights reserved .