A boundary element analysis of magnetic shielding for electron microscopes

Authors
Igarashi, H Kost, A Honma, T
Citation
H. Igarashi et al., A boundary element analysis of magnetic shielding for electron microscopes, COMPEL, 17(5-6), 1998, pp. 585-594
Citations number
6
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
COMPEL-THE INTERNATIONAL JOURNAL FOR COMPUTATION AND MATHEMATICS IN ELECTRICAL AND ELECTRONIC ENGINEERING
ISSN journal
03321649 → ACNP
Volume
17
Issue
5-6
Year of publication
1998
Pages
585 - 594
Database
ISI
SICI code
0332-1649(1998)17:5-6<585:ABEAOM>2.0.ZU;2-N