Study and characterization of a new MOSFET voltage controlled negative resistance for super selective IC tank circuits

Citation
A. Ramadan et al., Study and characterization of a new MOSFET voltage controlled negative resistance for super selective IC tank circuits, INT J ELECT, 86(3), 1999, pp. 311-319
Citations number
9
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
INTERNATIONAL JOURNAL OF ELECTRONICS
ISSN journal
00207217 → ACNP
Volume
86
Issue
3
Year of publication
1999
Pages
311 - 319
Database
ISI
SICI code
0020-7217(199903)86:3<311:SACOAN>2.0.ZU;2-T
Abstract
MOSFET transistors may be fabricated with a variety of gate geometries. The trapezoidal shape provides a new one of interest. If this non-standard geo metry is made dependent on the biasing condition, original behaviour and ne w I-V characteristics are expected to be obtained. This paper presents a st udy and characterization of this new device and shows that it provides a vo ltage controlled negative resistance. It is seen to have many noticeable ad vantages over existing devices. This new negative resistance should find a wide areas of application in communications, measurements and instrumentati on. It can be used to build up super selective tank circuits which can be e ntirely integrated using MOSFET technology.