Ordered In0.4Ga0.6As quantum dots (QDs), with the density of 10(9) cm(-2)-1
0(11) cm(-2), are fabricated on GaAs(311)B substrates by atomic-hydrogen as
sisted molecular beam epitaxy. The density and the dot size are mainly chan
ged by the growth temperature between 460 degrees C and 520 degrees C. In s
harp contrast to InAs, where we can hardly observe any ordering, and coales
cence or merging of dots occurs beyond a thickness of 4 monolayers, the hig
h-density In0.4Ga0.6As QDs do not coalesce even when the QDs are in contact
with each other. The inhomogeneuos distribution of In and Ga in the QDs wh
ich are In rich at the surface is found to be responsible for this unusual
behavior by reflection high energy electron diffraction studies. The atomic
force microscope images show that a surface coverage of nearly 100% can be
achieved. It implies the existence of lateral coupling between QDs, which
is strongly supported by the photoluminscence measurements.