Hw. Ren et al., Highly uniform and small InP/GaInP self-assembled quantum dots grown by metal-organic vapor phase epitaxy, JPN J A P 1, 38(1B), 1999, pp. 507-510
InP self-assembled quantum dots embedded in Ga0.51In0.49P were prepared by
metal-organic vapor phase epitaxy. In order to reduce the dot diameter and
improve the size uniformity, InP dots were grown at a low temperature using
tertiarybutylphosphine instead of phosphine. Growth of 4 ML InP on a 4 ML
GaP interface layer at 550 degrees C resulted in InP islands of about 30 nm
in base diameter and 7 nm in height that were remarkably uniform to within
10% deviation. The insertion of another 2 ML GaP interface layer between t
he InP islands and the GaInP cap-layer further reduced the half-width of th
e photoluminescence (PL) spectra from the InP dots to 29 meV at both 3 K an
d 77 K. It is necessary to grow the GaInP caplayer at higher than 630 degre
es C in order to alloy the undeveloped InP clusters and wetting layer with
GaP interface layers.