X-ray diffraction study of concentration depth profiles of binary alloy coatings during thermal diffusion: application to brass coating

Using the Houska method based on X-ray diffraction-line profile analysis, n ew mathematical treatments are proposed to compute directly the concentrati on depth profile of thin films obtained by diffusion. As an example, concen tration depth profiles of a brass layer have been studied during the therma l diffusion process. This nondestructive method is fast (a few minutes) and allows the sample to be used for complementary analysis if necessary.