Organic field-effect transistors, in which the active semiconductor is made
of oligothiophenes of various lengths, have been fabricated and characteri
zed. A method is developed to estimate the field-effect mobility mu correct
ed for the contact series resistance. The mobility is found to increase by
a factor of nearly 100 from quaterthiophene (4T) to octithiophene (8T). Mor
e importantly, mu increases quasilinearly with gate voltage. The origin of
this gate bias dependence is discussed. One explanation could be the presen
ce of traps that limit charge transport. Alternatively, the gate-voltage de
pendence is tentatively attributed to a dependence of the mobility with the
concentration of carriers in the accumulation layer. (C) 1999 American Ins
titute of Physics.