Gate voltage dependent mobility of oligothiophene field-effect transistors

Citation
G. Horowitz et al., Gate voltage dependent mobility of oligothiophene field-effect transistors, J APPL PHYS, 85(6), 1999, pp. 3202-3206
Citations number
22
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF APPLIED PHYSICS
ISSN journal
00218979 → ACNP
Volume
85
Issue
6
Year of publication
1999
Pages
3202 - 3206
Database
ISI
SICI code
0021-8979(19990315)85:6<3202:GVDMOO>2.0.ZU;2-Y
Abstract
Organic field-effect transistors, in which the active semiconductor is made of oligothiophenes of various lengths, have been fabricated and characteri zed. A method is developed to estimate the field-effect mobility mu correct ed for the contact series resistance. The mobility is found to increase by a factor of nearly 100 from quaterthiophene (4T) to octithiophene (8T). Mor e importantly, mu increases quasilinearly with gate voltage. The origin of this gate bias dependence is discussed. One explanation could be the presen ce of traps that limit charge transport. Alternatively, the gate-voltage de pendence is tentatively attributed to a dependence of the mobility with the concentration of carriers in the accumulation layer. (C) 1999 American Ins titute of Physics.