In this article the first calculation of hole transport in the 3C phase of
SiC is presented. The salient features of the model are the full band-struc
ture computed by the empirical pseudopotential method, a numerically calcul
ated hole-phonon scattering rate and the impact ionization transition rates
. The coupling constants necessary to determine the scattering rates have b
een determined either from available data in the literature or by fitting t
he calculated mobility values to low field experimental results. The impact
ionization transition rates have been determined directly from the band-st
ructure based on a wave-vector dependent dielectric function. The steady st
ate drift velocity as a function of the applied electric field strength is
computed for different field directions and doping concentrations. The calc
ulated results show the presence of an anisotropy in the drift velocity for
the field applied along different directions, similar to what is found in
silicon. The maximum values of the velocity are 1.63 x 10(7) cm s(-1) and 1
.43 x 10(7) cm s(-1) for the (100) and (111) field directions, respectively
. High field transport has also been studied. The calculated ionization coe
fficients show no appreciable anisotropy for the field applied along differ
ent directions. The second valence band contributes the most to the impact
ionization rate. It is further found that the ionization threshold is relat
ively soft. (C) 1999 American Institute of Physics.