A cone penetrometer X-ray fluorescence tool for the analysis of subsurfaceheavy metal contamination

Past use of X-ray fluorescence for the analysis of heavy metal contaminatio n in soil was limited to analyzing either collected samples or soil on an e xposed surface. To investigate subsurface contamination at even shallow dep ths, extensive and often expensive drilling or excavation was required to o btain either a sample or an exposed surface. A cone penetrometer X-ray fluo rescence tool has been developed by the US Army, Navy and Air Force Site Ch aracterization and Analysis Penetrometer System (SCAPS) to analyze subsurfa ce metal contamination in situ. Using this tool, subsurface metal contamina tion can be investigated in real time without sampling or excavation. A sch ematic diagram of the penetrometer tool is provided and operating capabilit ies are discussed. The results of bench testing and a calibration for lead contaminated standards are presented. (C) 1999 Elsevier Science B.V. All ri ghts reserved.