Example of a compound semiconductor surface that mimics silicon: The InP(001)-(2x1) reconstruction

Citation
L. Li et al., Example of a compound semiconductor surface that mimics silicon: The InP(001)-(2x1) reconstruction, PHYS REV L, 82(9), 1999, pp. 1879-1882
Citations number
28
Categorie Soggetti
Physics
Journal title
PHYSICAL REVIEW LETTERS
ISSN journal
00319007 → ACNP
Volume
82
Issue
9
Year of publication
1999
Pages
1879 - 1882
Database
ISI
SICI code
0031-9007(19990301)82:9<1879:EOACSS>2.0.ZU;2-F
Abstract
An InP(001)-(2 x 1) reconstruction was prepared by metal-organic vapor-phas e epitaxy. Scanning tunneling micrographs and infrared spectra of adsorbed hydrogen revealed that the (2 x 1) is terminated with a complete layer of b uckled phosphorous dimers, giving rise to p(2 x 2) and c(4 x 2) domains. A surface band gap of 1.2 +/- 0.2 eV was measured by scanning tunneling spect roscopy. The buckling can be explained by electron correlation among the da ngling bonds of pairs of phosphorous dimers. This allows the surface to ach ieve a lower energy, semiconducting state. This reconstruction mimics the S i(100)-(2 x 1), which is terminated with buckled silicon dimers. [S0031-900 7(99)08534-8].