Scaling in charge-density-wave relaxation: Time-resolved X-ray scattering measurements

Citation
Kl. Ringland et al., Scaling in charge-density-wave relaxation: Time-resolved X-ray scattering measurements, PHYS REV L, 82(9), 1999, pp. 1923-1926
Citations number
29
Categorie Soggetti
Physics
Journal title
PHYSICAL REVIEW LETTERS
ISSN journal
00319007 → ACNP
Volume
82
Issue
9
Year of publication
1999
Pages
1923 - 1926
Database
ISI
SICI code
0031-9007(19990301)82:9<1923:SICRTX>2.0.ZU;2-D
Abstract
Using time-resolved, high-resolution x-ray scattering techniques, we have m easured the evolution of the transverse structure of the NbSe3 Q(1) charge- density wave as it relaxes from the sliding state to the pinned state. Meas urements were made at temperatures between 70 and 120 K and at electric fie ld strengths between 2x and 10x the threshold for sliding. These time-depen dent data are accurately described by dynamic scaling theory.