We report on a core-level photoemission study of lanthanide silicides epita
xially grown on n-type Si(111). In the monolayer regime, an extremely low b
and bending is observed for the first time, with a Fermi-level position onl
y 0.08 +/- 9.05 eV below the conduction-band minimum of silicon. With incre
asing coverage, the Fermi-level position moves towards a final Schottky-bar
rier height of 0.32 +/- 0.05 eV. This behavior is assigned to the developin
g metallicity of the silicide overlayer.