Photoreflectance spectroscopy as a powerful tool for the investigation of GaN-AlGaN quantum well structures

Citation
Tj. Ochalski et al., Photoreflectance spectroscopy as a powerful tool for the investigation of GaN-AlGaN quantum well structures, SOL ST COMM, 109(9), 1999, pp. 567-571
Citations number
6
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
SOLID STATE COMMUNICATIONS
ISSN journal
00381098 → ACNP
Volume
109
Issue
9
Year of publication
1999
Pages
567 - 571
Database
ISI
SICI code
0038-1098(1999)109:9<567:PSAAPT>2.0.ZU;2-S
Abstract
Room-temperature photoreflectance spectroscopy is performed on a series of GaN-AlGaN quantum wells grown by molecular beam epitaxy. We show that the p otentialities of this powerful investigation method previously demonstrated to many low-dimensional systems can be extended to nitride-based quantum w ells for accurate large scale characterisation. In particular, this techniq ue allows us to get rid of optical interferences that usually prevent the o bservation of free-exciton transitions below the band-gap of GaN. Such tran sitions occur in wide quantum wells, because of large built-in electric fie lds which also quench the oscillator strength of the transitions. Also, thi s technique allows us to magnify the features of confined excited states, w hich are difficult to observe by standard reflectance. (C) 1999 Elsevier Sc ience Ltd. All rights reserved.