Polarity dependence of cumulative properties of charge-to-breakdown in very thin gate oxides (vol 41, pg 995, 1997)

Authors
Brozek, T Szyper, EC Viswanathan, CR
Citation
T. Brozek et al., Polarity dependence of cumulative properties of charge-to-breakdown in very thin gate oxides (vol 41, pg 995, 1997), SOL ST ELEC, 43(3), 1999, pp. 693-696
Citations number
1
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Eletrical & Eletronics Engineeing
Journal title
SOLID-STATE ELECTRONICS
ISSN journal
00381101 → ACNP
Volume
43
Issue
3
Year of publication
1999
Pages
693 - 696
Database
ISI
SICI code
0038-1101(199903)43:3<693:PDOCPO>2.0.ZU;2-I