G. Bar et al., Effect of tip sharpness on the relative contributions of attractive and repulsive forces in the phase imaging of tapping mode atomic force microscopy, SURF SCI, 422(1-3), 1999, pp. L192-L199
The way in which the sharpness of a tip affects phase imaging in tapping mo
de atomic force microscopy was examined by performing experiments on polyst
yrene and Si surfaces with tips of different sharpness. The dominant tip-sa
mple interaction controlling the cantilever vibration can be made repulsive
with a sharp tip, and attractive with a dull tip. When the dominant intera
ction is either attractive or repulsive, the magnitude of the phase shift (
Delta phi) increases with decreasing set-point ratio r(5p)=A(sp)/A(0), and
the Delta phi-vs.-r(sp) plots are nearly independent of the drive amplitude
, A,. These observations indicate that the cantilever vibration is affected
mainly by the amount of time the tip spends in going through the lower tur
ning point of each oscillation and by the forces whose force derivatives ch
ange sharply during this period. (C) 1999 Elsevier Science B.V. All rights
reserved.