The synthesis, characterization of new metal-bisdithiole complexes M-BDT and indexing on polycrystalline X-ray diffraction pattern

Citation
Zf. Hao et al., The synthesis, characterization of new metal-bisdithiole complexes M-BDT and indexing on polycrystalline X-ray diffraction pattern, CHEM J CH U, 20(1), 1999, pp. 9-13
Citations number
8
Categorie Soggetti
Chemistry
Journal title
CHEMICAL JOURNAL OF CHINESE UNIVERSITIES-CHINESE
ISSN journal
02510790 → ACNP
Volume
20
Issue
1
Year of publication
1999
Pages
9 - 13
Database
ISI
SICI code
0251-0790(199901)20:1<9:TSCONM>2.0.ZU;2-I
Abstract
Four new M-BDT complexes were prepared for the first time (M = Ni, BDT is d ithiole with nine S atoms). The study of elementary analysis, LR spectra an d UV spectra shows that the molecular formula of the four compounds can be expressed as [(CH3)(4)N](2)[Ni(C5S9)(2)] (1), [(C2H5)(4)N](2) [Ni(C5S9)(2)] (2), [(C4H9)(4)N](2) [Ni(C5S9)(2)] (3), [C(C6H5) (CH3)(3)N](2) [Ni(C5S9)(2 )] (4), respectively. The X-ray powder diffraction pattern of compound 1 wa s determined and its X-ray diffraction lines were indexed. The indexing res ults show that the crystal belongs to the monoclinic system with a simple m onoclinic lattice. The cell parameters of the crystal of complex 1: a=0. 68 0 nm, b=0. 714 nm, c=2. 302 nm, gamma=111. 4 degrees, Z=2.