Surface science issues in plasma etching

Citation
Gs. Oehrlein et al., Surface science issues in plasma etching, IBM J RES, 43(1-2), 1999, pp. 181-197
Citations number
71
Categorie Soggetti
Multidisciplinary,"Computer Science & Engineering
Journal title
IBM JOURNAL OF RESEARCH AND DEVELOPMENT
ISSN journal
00188646 → ACNP
Volume
43
Issue
1-2
Year of publication
1999
Pages
181 - 197
Database
ISI
SICI code
0018-8646(199901/03)43:1-2<181:SSIIPE>2.0.ZU;2-T
Abstract
Pattern transfer by plasma-based etching is one of several key processes re quired for fabricating silicon-based integrated circuits. We present a brie f review of elementary plasma-etching processes on surfaces and within inte grated-circuit microstructures-and an overview of recent work in our labora tory on plasma-etching aspects of the formation of self-aligned contacts to a polysilicon layer through a SiO2 layer and a SI3N4 etch-stop layer. The work illustrates the richness of associated surface science issues that mus t be understood and controlled in order to most effectively achieve plasma- based pattern transfer.