Pattern transfer by plasma-based etching is one of several key processes re
quired for fabricating silicon-based integrated circuits. We present a brie
f review of elementary plasma-etching processes on surfaces and within inte
grated-circuit microstructures-and an overview of recent work in our labora
tory on plasma-etching aspects of the formation of self-aligned contacts to
a polysilicon layer through a SiO2 layer and a SI3N4 etch-stop layer. The
work illustrates the richness of associated surface science issues that mus
t be understood and controlled in order to most effectively achieve plasma-
based pattern transfer.