Ultra-low absorption measurement in dielectrics in millimeter- and submillimeter-wave range

A measurement of ultra-low absorption of microwave radiation in dielectrics is reported. Two Fabry-Perot resonators with greater than or equal to 600 000 quality factors, fully general-purpose interface bus programmable milli meter-wave frequency synthesizer with 10-15-mW continuous wave (CW) power l evel, 100-Hz frequency resolution from 78 to 118 GHz, and corresponding har dware and software for signal processing were used. The +/-500-Hz accuracy of resonance curve width measurements was reached, This high accuracy allow ed loss tangent measurement as small as 10(-6) -10(-7) in dielectric sample s with a thickness of similar to 0.5 mm, A convenient method of measurement s of almost arbitrary plane parallel samples has been developed and describ ed, Practical applications such as development and control of thin low-loss resonant windows of powerful (similar to 1-MW CW) gyrotrons used in thermo nuclear experiments, precise reflection coefficient of metals measurements, as well as other applications are discussed. The existence of such techniq ue up to frequencies exceeding 1 THz makes measurements described at the wh ole millimeter- and submillimeter-wave bands affordable.