Waveguide characterization of chiral material: Theory

Citation
J. Reinert et al., Waveguide characterization of chiral material: Theory, IEEE MICR T, 47(3), 1999, pp. 290-296
Citations number
15
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES
ISSN journal
00189480 → ACNP
Volume
47
Issue
3
Year of publication
1999
Pages
290 - 296
Database
ISI
SICI code
0018-9480(199903)47:3<290:WCOCMT>2.0.ZU;2-V
Abstract
A new procedure to extract all three constitutive parameters of chiral mate rial from waveguide measurements is presented, Two chiral slabs of differen t length must be measured, Their scattering parameters are inverted in a la rgely analytical way, complemented by a simple and fast convergent numerica l algorithm. Tests with synthetic scattering data show the method to be ver y. accurate and stable.