Non-destructive testing using electronic speckle pattern interferometry

Citation
V. Toal et al., Non-destructive testing using electronic speckle pattern interferometry, INSIGHT, 41(3), 1999, pp. 135-141
Citations number
13
Categorie Soggetti
Instrumentation & Measurement
Journal title
INSIGHT
ISSN journal
13542575 → ACNP
Volume
41
Issue
3
Year of publication
1999
Pages
135 - 141
Database
ISI
SICI code
1354-2575(199903)41:3<135:NTUESP>2.0.ZU;2-J
Abstract
At the Centre for Industrial and Engineering Optics a new Electronic Speckl e Pattern Interferometry (ESPI) system has been developed for non-destructi ve testing and strain measurements. The system uses a liquid crystal electr o-optical switch to change between the illumination geometries for sensitiv ity in two orthogonal directions. Two more liquid crystal devices provide p hase-shifting for automated analysis and the system is controlled by advanc ed software. There are no moving parts, which is an advantage in any ESPI s ystem, where mechanical stability is vital.