Characterization of porous aluminium oxide films from ac impedance measurements

Citation
Ja. Gonzalez et al., Characterization of porous aluminium oxide films from ac impedance measurements, J APPL ELEC, 29(2), 1999, pp. 229-238
Citations number
19
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
JOURNAL OF APPLIED ELECTROCHEMISTRY
ISSN journal
0021891X → ACNP
Volume
29
Issue
2
Year of publication
1999
Pages
229 - 238
Database
ISI
SICI code
0021-891X(199902)29:2<229:COPAOF>2.0.ZU;2-C
Abstract
An equivalent circuit (EC) that reproduces the a.c. impedance of porous alu minium oxide films in a highly approximate manner is proposed. The results reveal that electrochemical impedance spectroscopy (EIS) is a powerful tool for obtaining detailed information on the electrochemical properties of bo th the porous and barrier layer on which the corrosion resistance of alumin ium depends. The impedance at a given frequency can be used for accurate ca lculation of the electrochemical parameter for the oxide film represented b y each element of the EC. In this way, the effects of any factor on sealing and ageing of anodized aluminium oxide films can be precisely analysed. Th e EIS technique provides an effective, advantageous alternative to existing seal quality control tests.