A study of recorded bit patterns using TEM and MFM

A method used to examine recordings made in an experimental XY contact reco rding system is described. PtCo thin films were deposited onto a silicon su bstrate coated with silicon nitride and data patterns were recorded at vari ous frequencies. Electron transparent windows were then etched into the bac k surface so that the microstructure and magnetic structure could be examin ed in the TEM. As there was no further specimen preparation involved, the s ame sample could also be examined using an MFM. Magnetic and microstructura l images of the sample taken using the different microscopy techniques are presented and discussed. (C) 1999 Elsevier Science B.V. All rights reserved .