Copper indium diselenide films were prepared by graphite box annealing of s
tacked elemental layer (SEL) precursors. Effects of annealing temperature a
nd ambient atmosphere on the microstructural, optical and electrical proper
ties were studied critically. Pt measurements were also carried out to find
information on the defect levels. From the above studies, the optimum cond
ition for the deposition of high quality CuInSe2 films by this technique wa
s determined. (C) 1998 Elsevier Science S.A. All rights reserved.