A Kerr magnetometer using a four pole electromagnet is described which allo
ws the measurement of the Kerr rotation and ellipticity of a magnetic sampl
e in both polar and longitudinal geometries without changing the optical pa
th or the sample position. A maximum field of 4 kOe can be applied in any d
irection of the plane of the incident light. A continuous recording of the
magnetization curves is possible during the growth of ultrathin metallic la
yers on a substrate in an ultra high vacuum system. (C) 1999 Elsevier Scien
ce Ltd. All rights reserved.