Location resolved texture analysis

A texture-scanning goniometer is described based on the Seifert Texture-Str ess goniometer. It is equipped with a totally reflecting glass capillary as a collimator for the incident beam and a computer controlled xyz-table as the sample stage. The obtained location resolving power is in the order of 0.1 mm. The instrument can be used with a conventional scintillation detect or, a position sensitive detector or an energy-dispersive electroluminiscen ce detector. The obtainable location resolution and orientation resolution are related to each other by an uncertainty relationship which depends on g rain size. As an example texture fields in a "spike-rolled" profile were measured. Fro m texture field data the local physical properties of the material such as the local Taylor factor, r-values or Young's modulus can be calculated. Pro perty variations in the material can thus be detected with a location resol ution which is impossible to obtain by mechanical measurements.