Decay and dephasing of image-potential states due to surface defects and disorder

Authors
Weinelt, M Reuss, C Kutschera, M Thomann, U Shumay, IL Fauster, T Hofer, U Theilmann, F Goldmann, A
Citation
M. Weinelt et al., Decay and dephasing of image-potential states due to surface defects and disorder, APP PHYS B, 68(3), 1999, pp. 377-381
Citations number
19
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS B-LASERS AND OPTICS
ISSN journal
09462171 → ACNP
Volume
68
Issue
3
Year of publication
1999
Pages
377 - 381
Database
ISI
SICI code
0946-2171(199903)68:3<377:DADOIS>2.0.ZU;2-V
Abstract
The dynamics of electrons in image-potential states has been studied by mea ns of time- and energy-resolved two-photon photoemission. The loss of coher ence in quantum-beat spectroscopy shows directly the influence of pure deph asing which can be determined also from the difference between the results of linewidth and decay rate measurements. We present several examples for t he correlation of decay and dephasing with surface defects and disorder.